The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field
of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes
or detected particles in the investigation.
Subject areas covered ... click here for full Aims & Scope
The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field
of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes
or detected particles in the investigation.
Subject areas covered include: synchrotron radiation science; surfaces, interfaces,
and thin films; semiconductor physics and chemistry; materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated
systems, polymers, biomaterials and other organic films; catalysis; solid state physics; atomic and molecular physics. The journal encourages
contributions in the general area of atomic, molecular, ionic, and surface spectroscopy carried out using electron impact, synchrotron
radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron
radiation is combined with electron velocity analysis are especially welcome. The individual techniques of electron spectroscopy include
photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; Auger spectroscopy including
ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) spectro-microscopy, high resolution electron energy loss spectroscopy;
electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy
including scanning tunneling spectroscopy; theoretical treatments of the photoemission, Auger, energy loss and Penning ionization processes.
Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.
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Editors:
A.P. Hitchcock
N. Kosugi
J-J. Pireaux
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