Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability
of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation
and prediction; modelling and simulation; methodologies and assurance. Papers which ... click here for full Aims & Scope
Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability
of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation
and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of
microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting
case studies in the field are particularly encouraged.
Most accepted papers will be published as Research Papers, describing
significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication
as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current
interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts
in the field.
Additional regular features will include:
• special issues devoted to significant international conferences,
or to important developing topics
• letters to the Editors
• industrial news and updates
• calendar of forthcoming
events
• book reviews
Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience
between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way
with a steadily growing microelectronics industry and its many fields of application.
Hide Aims & Scope
Joint Editors-in-Chief
Professor N.D. Stojadinovic
Professor M. Pecht
Home | Elsevier Sites | Privacy Policy | Terms and Conditions | Feedback | Site Map | A Reed Elsevier Company