Search:

Product Information All Elsevier Sites   Advanced Product Search
SiteStat.jsp

Microelectronics Reliability

Microelectronics Reliability on ScienceDirect(Opens new window)
ISSN: 0026-2714
Imprint: PERGAMON

Statistics
Impact Factor: 1.290
Issues per year: 12
Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which ... click here for full Aims & Scope

Joint Editors-in-Chief
N.D. Stojadinovic
M Pecht





 
This is a spacer...