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 Former title: Microelectronics and Reliability
Joint Editors-in-Chief
N.D. Stojadnovic, M.G. Pecht
See editorial board for all editors information
Description
Microelectronics Reliability is dedicated to disseminating the latest research results and related information
on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics
and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with
other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and
practical papers reporting case studies in the field are particularly encouraged.
Most accepted papers will be published as Research
Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may
be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed
practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer
review by leading experts in the field.
Additional regular features will include:
• special issues devoted to significant
international conferences, or to important developing topics
• letters to the Editors
• industrial news and updates
•
calendar of forthcoming events
• book reviews
Microelectronics Reliability is an indispensable forum for the exchange
of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all
those associated in any way with a steadily growing microelectronics industry and its many fields of application.
Bibliographic & ordering information
ISSN: 0026-2714
Imprint: PERGAMON
Commenced publication 1962
Subscriptions for the year 2008,
Volume 48,
12 issues
Institutional online access: ScienceDirect eSelect
For purchase of online access to this journal on ScienceDirect.
Institutional price: Order form
USD 3,575 for all countries except Europe, Japan and Iran
EUR 3,195 for European countries and Iran
JPY 424,200 for Japan
Conditions of sale & ordering procedures, and links to our regional sales offices.
For an overview of recently-dispatched issues, see the Journal issue
dispatch dates
Audience
Electrical and electronics engineers and other engineers involved in the reliability, design, fabrication, packaging and testing of microelectronic devices, circuits and systems.
Impact factor of this journal
2007: 1.011
© Journal Citation Reports 2008, published by Thomson Reuters
607/577
Last update: 23 Jul 2008
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