Microelectronics Reliability

Microelectronics Reliability
ISSN: 0026-2714
Imprint: ELSEVIER

Facts & Figures
Impact Factor: 1.066
5-Year Impact Factor: 1.024
Issues per year: 12
Commenced publication 1962

Ordering Information


Subscriptions for the year 2012, Volume 52, 12 issues

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Audience

Electrical and electronics engineers and other engineers involved in the reliability, design, fabrication, packaging and testing of microelectronic devices, circuits and systems.

Journal Issue Dispatch Dates

The dispatch dates of the last 12 months are given with a maximum of 12 issues.

VolumeIssueDispatch Date
52517 May 2012
524 9 March 2012
523 9 March 2012
52227 January 2012
52117 January 2012
5112 9 December 2011
519/1121 September 2011
51811 July 2011
51720 June 2011
51626 May 2011
 
  24 May 2012