Home | Site map | Elsevier websites | Alerts
Elsevier
Product information search
Search all Elsevier sites
Search
Advanced Product Search
Go to Elsevier home page
SiteStat.jsp
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Journal of Electron Spectroscopy and Related Phenomena
Editors:
A.P. Hitchcock, N. Kosugi, J.J. Pireaux
See editorial board for all editors information



>> AHMED ZEWAIL PRIZE IN MOLECULAR SCIENCES

Description


The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.

Subject areas covered include: synchrotron radiation science; surfaces, interfaces, and thin films; semiconductor physics and chemistry; materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films; catalysis; solid state physics; atomic and molecular physics. The journal encourages contributions in the general area of atomic, molecular, ionic, and surface spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation is combined with electron velocity analysis are especially welcome. The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.



Bibliographic & ordering information
ISSN: 0368-2048
Imprint: ELSEVIER
Commenced publication 1973

Subscriptions for the year 2009, Volumes 170-176, 21 issues

Institutional online access: ScienceDirect eSelect
For purchase of online access to this journal on ScienceDirect.

Personal price: Order form
EUR 161 for European countries and Iran
USD 216 for all countries except Europe, Japan and Iran
JPY 24,900 for Japan

Institutional price: Order form
EUR 4,214 for European countries and Iran
JPY 559,600 for Japan
USD 4,714 for all countries except Europe, Japan and Iran


Conditions of sale & ordering procedures, and links to our regional sales offices.

For an overview of recently-dispatched issues, see the Journal issue dispatch dates

Audience
Physicists, Chemists, Surface Scientists and Technologists using the techniques of electron spectroscopy in their work.

Impact factor of this journal
2007: 1.082
© Journal Citation Reports 2008, published by Thomson Reuters



601/155
Last update: 14 Aug 2008
For Readers
Free Tables of contents and abstracts
Full text in ScienceDirect
Sample issue
Free volume/issue alert
CONTENTS-Alert: Surfaces, Interfaces and Thin Films
For Authors
Guide for authors
Submit your article
Track your accepted article
For Editors
Tracking for Editors
Related websites
Physics Connect
Free Volume/Issue Alert with links to full-text articles
Publishing Ethics Resource Kit (PERK)
Artwork Instructions
Search through the articles of this journal powered by  Scirus
Bookmark this page
Recommend this publication
Overview of all journals
Printer-friendly version   Printer-friendly version
 Home | Site map | Privacy policy | Terms and Conditions | Feedback | A Reed Elsevier company
 Copyright © 2008 Elsevier B.V. All rights reserved.