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Microelectronics Reliability

Microelectronics Reliability
ISSN: 0026-2714
Imprint: PERGAMON

Statistics
Impact Factor: 1.290
5-Year Impact Factor: 1.182
Issues per year: 12

Abstracting and Indexing


  • Computer Contents
  • Current Contents/Engineering, Computing & Technology
  • Engineering Index
  • INSPEC Data/Cam Sci Abstr
  • Information Science Abstracts
  • Operations Research & Management Science
  • SSSA/CISA/ECA/ISMEC
  • Science Citation Index
  • Scopus
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