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ADVANCES IN IMAGING AND ELECTRON PHYSICS, 114
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To order this title, and for more information, click here
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Reviews
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in
a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development
in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in
Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety
of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
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