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ADVANCES IN IMAGING AND ELECTRON PHYSICS, 109
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Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Reviews
--MRS BULLETIN, Praise for the Series
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics,
results in a volume that will be a handsome addition to any bookshelf."
--J.A. Chapman in LABORATORY PRACTICE
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is
becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated
on bringing together in a convenient and comprehensible form a variety of topics of current interest."
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