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| CHARACTERIZATION OF AMORPHOUS AND CRYSTALLINE ROUGH SURFACE -- PRINCIPLES AND APPLICATIONS, 37
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Marc De Graef, Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.
Y-P Zhao, Rensselaer Polytechnic Institute, Troy, New York, U.S.A.
Thomas Lucatorto, National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.
G. Wang, Rensselaer Polytechnic Institute, Troy, New York, U.S.A.
Toh-Ming Lu, Rensselaer Polytechnic Institute, Troy, New York, U.S.A.
Included in series
Experimental Methods in the Physical Sciences,
Description
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also
is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not
always smooth.
In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods
in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications
will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book
thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary
nature of the real space and diffraction techniques is fully displayed.
Audience
Experimental researchers, graduate students, and industrial practitioners in applied physics (especially in the areas of thin film growth,
optical coating, plasma etching, patterning, machining, polishing, fracture, tribology, and related areas)
| Bibliographic details |
Hardbound, 417 pages, publication date: OCT-2000
ISBN-13: 978-0-12-475984-8
ISBN-10: 0-12-475984-X
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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USD 206
EUR 146.95
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Last update: 3 Oct 2009
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