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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 165
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Optics of Charged Particle Analyzers
To order this title, and for more information, click here
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Contents
1. Charged particles in electromagnetic fields
2. Language of aberration expansions in charged particle optics
3. Transporting charged
particle beams in static fields
4. Transporting charged particles in radiofrequency fields
5. Static magnetic charged particle analyzers
6. Electrostatic energy analyzers
7. Mass analyzers with combined electrostatic and magnetic fields
8. Time-of-flight mass analyzers
9. Radiofrequency mass analyzers
| Bibliographic details |
Hardbound, 408 pages, publication date: OCT-2010
ISBN-13: 978-0-12-381310-7
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
GBP 110
USD 215
EUR 160
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Last update: 3 Oct 2009
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