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| CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES AND NANOSTRUCTURES
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To order this title, and for more information, click here
Edited By
Carlo Lamberti, Department of Inorganic, Physical & Materials Chemistry, University of Torino, Italy
Description
Characterization of Semiconductor Heterostructures and Nanostructures? is structured so that each chapter is devoted to a specific
characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor
quantum wells and superlattices. An additional chapter is devoted to ab initio modeling.
The book has two basic aims.
The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced
students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples
from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures
and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second
to the discussion of the most peculiar and innovative examples.
The topic of quantum wells, wires and dots should be seen
as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at
the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely
hot, field of Nanotechnology.
Audience
This book is suitable for researchers and professors and Master and PhD students in physics, chemistry, materials science and engineering fields.
Contents
Chapter 1. Introduction (C. Lamberti)
Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi
and S. Baroni)
Chapter 3. Electrical and optical properties of heterostructures (TBC)
Chapter 4. Strain and composition determination
in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)
Chapter 5. Transmission Electron
Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)
Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M.
Guzzi and M. Gurioli)
Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening
to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)
Chapter 8. Raman Spectroscopy (D. Wolverson)
Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)
Chapter 10. Nanostructures in the light of synchrotron radiation:
surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Sch
lli)
Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures
(M. Grazia Proietti, J. Coraux and H. Renevier)
Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)
Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev)
| Bibliographic details |
Hardbound, 496 pages, publication date: JUN-2008
ISBN-13: 978-0-444-53099-8
ISBN-10: 0-444-53099-1
Imprint: ELSEVIER
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| Price and Ordering |
Price:
GBP 111.99
EUR 131.95
USD 185
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Last update: 25 Nov 2009
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