By
Laung-Terng Wang, SynTest Technologies, Inc., Sunnyvale, CA, USA
Charles Stroud, Auburn University, Auburn, AL, U.S.A.
Nur Touba, University of Texas, Austin, TX, U.S.A.
Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies
with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from
consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost.
This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers,
DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory,
and analog/mixed-signal designs.
Included in series
Systems on Silicon
Audience:
Practitioners/Researchers in VLSI Design and Testing; Design or Test Engineers, as well as research institutes.
