By
Francis Wong, Seattle University, Washington
Description
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits
and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next
generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques
now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This
book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides
real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Audience:
Professional engineers involved in designing, testing, and manufacturing digital integrated circuits and printed circuit boards.
