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ION BEANS FOR MATERIALS ANALYSIS
Ion Beans for Materials Analysis

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Edited By
R. Bird, Auburn University, Alabama
J. Williams, Microelectronics and Materials Technology Centre, RMIT

Description
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Audience
Research scientists in chemistry, archaeology, and analytical techniques.

Contents
Concepts and Principles of Ion Beam Analysis. Techniques and Equipment. High Energy Ion Scattering Spectrometry. Nuclear Reactions. Ion Induced X-ray Emission. Channelling. Depth Profiling of Surface Layers during Ion Bombardment. Low Energy Ion Scattering from Surfaces. Ion Scattering from Surfaces and Interfaces. Microprobe Analysis. Critical Assessment of Analysis Capabilities. General Methods. Directory of Materials. Data Lists.

Bibliographic details
Hardbound, 719 pages, publication date: NOV-1989
ISBN-13: 978-0-12-099740-4
ISBN-10: 0-12-099740-1
Imprint: ACADEMIC PRESS

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USD 275
EUR 237.95
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Last update: 4 Sep 2009
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