Series Editor:
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Charles Sheppard, The University of Sydney, Australia
Description
Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists,
and researchers interested in microscope instrumentation and applications rangingfrom biological techniques to materials research and
industrial inspection.
Included in series
Advances in Optical and Electron Microscopy
Audience:
Microscopists, applied physicists, metallurgists, materials scientists, electrical and electronic engineers.
