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| HOT-CARRIER EFFECTS IN MOS DEVICES
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To order this title, and for more information, click here
By
Eiji Takeda, Hitachi Ltd.
Cary Yang, Santa Clara University
Akemi Miura-Hamada, Hitachi Ltd.
Description
The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing
as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.
This book is
derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However,
the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental
text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced
area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.
Audience
The primary audience for this book includes silicon process, device, and design engineers (especially those in R&D), and scientists, as well as graduate students and researchers in silicon device technology, solid state science, electrical and electronic engineering, materials
science, engineering, physics, and chemistry.This book is also suitable as a supplementary text for a graduate or short course on advanced
MOS devices, device reliability, hot-carrier effects in MOS devices, VLSI device physics, or advanced CMOS design. It is useful for
students working on device reliability research.
Contents
(Chapter Headings): MOS Device Fundamentals. Hot-Carrier Injection Mechanisms. Hot-Carrier Device Degradation. AC and Process-Induced
Hot-Carrier Effects. Hot-Carrier Effects at Low Temperature and Low Voltage. Dependence of Hot-Carrier Phenomena on Device Structure.
As-P Double Diffused Drain (DDD) Versus Lightly Doped Drain (LDD) Devices. Gate-to-Drain Overlatpped Devices (GOLD). References. Index.
| Bibliographic details |
Hardbound, 312 pages, publication date: NOV-1995
ISBN-13: 978-0-12-682240-3
ISBN-10: 0-12-682240-9
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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EUR 91.95
USD 115
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Last update: 4 Sep 2009
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