By
Eiji Takeda, Hitachi Ltd.
Cary Yang, Santa Clara University
Akemi Miura-Hamada, Hitachi Ltd.
Description
The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing
as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.
This book is
derived from Dr. Takedas book in Japanese,
Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However,
the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental
text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced
area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.
Audience:
The primary audience for this book includes silicon process, device, and design engineers (especially those in R&D), and scientists, as
well as graduate students and researchers in silicon device technology, solid state science, electrical and electronic engineering, materials
science, engineering, physics, and chemistry.This book is also suitable as a supplementary text for a graduate or short course on advanced
MOS devices, device reliability, hot-carrier effects in MOS devices, VLSI device physics, or advanced CMOS design. It is useful for
students working on device reliability research.
