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| CONFOCAL SCANNING OPTICAL MICROSCOPY AND RELATED IMAGING SYSTEMS
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To order this title, and for more information, click here
By
Gordon Kino, Stanford University
Timothy Corle, National Applied Science
Description
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates
mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive
discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given.
The text discusses the practical
aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes
to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth
and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be
used to help understand the operation of these microscopes.
Audience
Optical scientists, engineers, materials scientists, semiconductor testing engineers, biologists in testing instrumentation, and graduate students in these areas.
Contents
Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.
| Bibliographic details |
Hardbound, 335 pages, publication date: AUG-1996
ISBN-13: 978-0-12-408750-7
ISBN-10: 0-12-408750-7
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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USD 130
EUR 104.95
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Last update: 4 Sep 2009
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