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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 145
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To order this title, and for more information, click here
By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics
and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially
semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic
wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Contents
Applications of noncausal Guass Markov random processes in multidimensional image processing (A. Asif).
Direct detection devices for electron
microscopy (A.R. Faruqi).
Exploring third-order chromatic aberrations of electron lenses with computer algebra (Zhixiong Liu).
Multivalued
diffusion PDEs for image regularization, (D. Tschumperlé, R. Deriche).
| Bibliographic details |
Hardbound, 240 pages, publication date: MAR-2007
ISBN-13: 978-0-12-373907-0
ISBN-10: 0-12-373907-1
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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GBP 129.99
EUR 153.95
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Last update: 25 Nov 2009
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