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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 132
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 To order this title, and for more information, click here
By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
To order this title, and for more information, click http://nl.sitestat.com/elsevier/elsevier-com/s?st&ns_type=clickout&ns_url=[http://books.elsevier.com/bookscat/links/details.asp?isbn= &ref=CWS1] here
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Contents
Evanescent Waves in the Near and the Far Field (ARNOLDUS); Symmetry and the Karhunen-Loeve Decomposition (LAHME); Analysis of Irregularly
Sampled Data: A Review (PIRODDI and PETROU); Recent Developments in the Microscopy of Ceramics (RAINFORTH); Five Dimensional Hamilton-Jacobi
Approach to Relativistic Quantum Mechanics (ROSE); Redundant Multiscale Transforms and Their Application for Morphological Component
Separation (STARK, ELAD and DONOHO)
Bibliographic & ordering Information
Hardbound, 400 pages, publication date: AUG-2004
ISBN-13: 978-0-12-014774-8
ISBN-10: 0-12-014774-2
Imprint: ACADEMIC PRESS
Price: Order form
GBP 110
EUR 160
USD 215
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Last update: 14 Aug 2008
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