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| APPLICATIONS OF SYNCHROTRON RADIATION TO MATERIALS ANALYSIS
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 Buy online with a credit card in the Elsevier Science & Technology Bookstore:  http://books.elsevier.com/elsevier/?isbn=0444888578
Edited by
H. Saisho, Liaison Office, Ritsumeikan University, Shiga, Japan
Y. Gohshi, University of Tokyo, Tokyo, Japan
Included in series
Analytical Spectroscopy Library, 7
Description
Synchroton radiation (SR) is utilized in most scientific fields. This book will therefore be useful not only for researchers engaged in
analytical chemistry, and those studying the basic fields such as physics, chemistry, biology, as well as earth science, medicine, and
life science but also for those engaged in research for elucidating structure of material and its function in the application fields
including applied physics, semiconductor engineering, and metal engineering. The book has a highly interdisciplinary character. The outstanding
characteristics of SR have also contributed to the rapid development of new fields and applications in analytical chemistry.
Features
of this book:
• Explains the basics of SR
• Facilities and instrumentation are covered to facilitate the planning of
experiments using SR.
• Aspects for the future development of SR are included together with an introduction to the latest techniques
which are expected to find increasing use in the coming years.
This book should stimulate students specializing in analytical chemistry
and materials science to have an interest in SR. In addition, it will provide scientists who are beginning analytical chemistry research using SR with instructive and illustrative descriptions. The book can also be used as an explanatory text for advanced research on the
application of SR.
Contents
Preface. 1. Basic characteristics of synchrotron radiation and its related facilities and instrumentation (M. Terasawa, M. Kihara). 2.
X-ray fluorescence analysis (H. Saisho, H. Hashimoto). 3. Microbeam and chemical state analysis (S. Hayakawa, Y. Gohshi). 4. X-ray absorption
fine structure (H. Oyanagi). 5. Application to surface structure analyses (T. Ohta, K. Asakura, T. Tokoyama). 6. Structure analysis by
small-angle X-ray scattering (K. Kajiwara, Y. Hiragi). 7. The Rietveld method and its applications to synchrotron X-ray powder data (F.
Izumi). X-ray microtomography (K. Usami, T. Hirano). Subject index.
| Bibliographic details |
Hardbound, 510 pages, publication date: AUG-1996
ISBN-13: 978-0-444-88857-0
ISBN-10: 0-444-88857-8
Imprint: ELSEVIER
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| Price and Ordering |
Price:
USD 332.95
EUR 333
GBP 222
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Last update: 26 Sep 2008
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