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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 156
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To order this title, and for more information, click here
Edited By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Contents
1. Photometric Stereo: an overview, M. Petrou, A. Vasileios
2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper,
F. Sommen
3. Carbon nanotube electron sources for electron microscopes, N. de Jonge
4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached
| Bibliographic details |
Hardbound, 376 pages, publication date: FEB-2009
ISBN-13: 978-0-12-374762-4
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
USD 215
GBP 129.99
EUR 153.95
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Last update: 24 Sep 2009
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