Home | Site map | Elsevier websites | Alerts
Elsevier
Product information search
Search all Elsevier sites
Search
Advanced Product Search
Go to Elsevier home page
Products
Statistics and Probability
Browse products within subject
All product types
Books
Journals
Support & contact
About Elsevier
Select your view
SiteStat.jsp
MEET THE EDITORS

Editor-in-Chief

Editor-in-Chief Byeong U. Park

Byeong U. Park
Byeong U. Park is a Professor of Seoul National University. He holds degrees from Seoul National University and University of California at Berkeley. He has conducted his leadership research in nonparametric smoothing, semiparametric inference, statistical learning, boundary estimation, stochastic frontier estimation, and asymptotic analysis in general, for nearly twenty years. He has been playing a leading role in the Korean statistical community and serving valued editorial work. He is a Fellow of American Statistical Association and of Institute of Mathematical Statistics.

Co-Editors

Co-Editor Peter Hall

Peter Hall
Peter Hall is a Professor of Statistics at the University of Melbourne.  He holds degrees from the University of Sydney, the Australian National University and Oxford University, and has been an active researcher in statistics and probability theory for more than thirty years.  He is a Fellow of the Australian Academy of Science and of the Royal Society of London, and a Corresponding Fellow of the Royal Society of Edinburgh.

 

Co-Editor Qiwei Yao

Qiwei Yao
Qiwei Yao is a Professor of Statistics at the London School of Economics and Political Science. His research interest includes time series analysis, spatial-temporal modelling, semiparametric and nonparametric regression, and high-dimensional data analysis. He is a Fellow of the Institute of Mathematical Statistics and an Elected Member of the International Statistical Institute.

 

<< back to Journal of the Korean Statistical Society's homepage



  
Printer-friendly version   Printer-friendly version
 Home | Site map | Privacy policy | Terms and Conditions | Feedback | A Reed Elsevier company
 Copyright © 2008 Elsevier B.V. All rights reserved.