Optik

International Journal for Light and Electron Optics

Optik - ISSN 0030-4026
Source Normalized Impact per Paper (SNIP): 0.68 Source Normalized Impact per Paper (SNIP):
SNIP measures contextual citation impact by weighting citations based on the total number of citations in a subject field.
SCImago Journal Rank (SJR): 0.364 SCImago Journal Rank (SJR):
SJR is a prestige metric based on the idea that not all citations are the same. SJR uses a similar algorithm as the Google page rank; it provides a quantitative and a qualitative measure of the journal’s impact.
Impact Factor: 0.742 (2015) Impact Factor:
The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years.
© Thomson Reuters Journal Citation Reports 2015
5 Year Impact Factor: 0.69 (2015) Five-Year Impact Factor:
To calculate the five year Impact Factor, citations are counted in 2014 to the previous five years and divided by the source items published in the previous five years.
© Journal Citation Reports 2015, Published by Thomson Reuters
Volumes: Volumes 128-151
Issues: 24 issues
ISSN: 00304026
Editor-in-Chief: Tschudi

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Description

Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields:

Optics:

  • Optics design, geometrical and beam optics, wave optics
  • Optical and micro-optical components, diffractive optics, devices and systems
  • Photoelectric and optoelectronic devices
  • Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials
  • Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis
  • Optical testing and measuring techniques
  • Optical communication and computing
  • Physiological optics
  • As well as other related topics.

Electron optics:

  • All methods strongly related to light optics, e.g. geometrical electron optics, imaging theories and methods, GRIN optics, geometrical aberration
  • Instrumentation and equipments for guiding, focusing and imaging of charged particles, spectrometers and beam lithography
  • Image reconstruction and analysis, holographic methods
It publishes original papers and short notes on theoretical and experimental research in English. OPTIK addresses itself especially to scientific and technical working specialists in this field.