Editor-in-Chief

  • T.A. Miller

    The Ohio State University, Columbus, Ohio, USA

Editorial Board

  • E. Arunan

    Indian Institute of Science, Bangalore, India

  • V. Boudon

    Université Bourgogne Franche-Comté, Dijon, France

  • T. Carrington

    Queens University, Canada, Kingston, Ontario, Canada

  • S. Cooke

    State University of New York (SUNY) at Purchase, New York, New York, USA

  • R. Dawes

    Missouri University of Science and Technology, Rolla, Missouri, USA

  • G Douberly

    University of Georgia, Athens, Georgia, USA

  • C. Duan

    Central China Normal University, Wuhan, China

  • J.T. Hougen

    National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA

  • Y.C. Hsu

    Academia Sinica, Taipei, Taiwan

  • T.R. Huet

    Université Lille 1, Villeneuve d’Ascq, France

  • W. Jaeger

    University of Alberta, Edmonton, Alberta, Canada

  • H. Kanamori

    Tokyo Institute of Technology

  • K. Kobayashi

    University of Toyama, Toyama, Japan

  • H.V.J. Linnartz

    Universiteit Leiden, Leiden, Netherlands

  • B.J. McCall

    University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

  • Y. Mo

    Tsinghua University, Beijing, China

  • A. Predoi-Cross

    University of Lethbridge, Lethbridge, Alberta, Canada

  • S. Schlemmer

    Universität zu Köln, Köln, Germany

  • T. Sears

    Brookhaven National Laboratory, Upton, New York, USA

  • M.Y. Tretyakov

    Institute of Applied Physics, Nizhny Novgorod, Russian Federation

  • W.M.G. Ubachs

    VU University, Amsterdam, Netherlands

  • N.R. Walker

    Newcastle University, Newcastle Upon Tyne, UK

  • S. Widicus Weaver

    Emory University, Atlanta, Georgia, USA

  • S.N. Yurchenko

    University College London (UCL), London, UK

Editor Emeritus

  • A.J. Merer

    University of British Columbia, Vancouver, British Columbia, Canada