Thin Solid Films
SNIP measures contextual citation impact by weighting citations based on the total number of citations in a subject field.
SJR is a prestige metric based on the idea that not all citations are the same. SJR uses a similar algorithm as the Google page rank; it provides a quantitative and a qualitative measure of the journal’s impact.
The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years.
© 2017 Journal Citation Reports ® (Clarivate Analytics, 2017)
To calculate the five year Impact Factor, citations are counted in 2016 to the previous five years and divided by the source items published in the previous five years.
© 2017 Journal Citation Reports ® (Clarivate Analytics, 2017)
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Description
Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor. The scope of Thin Solid Films is indicated by, but not limited to, the following topical subheadings:
• A. Synthesis and Characterization
• B. Surfaces, Interfaces, and Colloidal Behaviour
• C. Metallurgical, Protective, and Hard Layers
• D. Mechanics and Nanomechanics of Thin Layers
• E. Electronics, Optics, and Opto-electronics
• F. Magnetics and Magneto-optics
• G. Superconductivity
• H. Langmuir—Blodgett, Biological, and Related Films
• I. Thin Film Devices, Sensors, and Actuators
• J. Condensed Matter Film Behaviour.
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