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Microelectronics Reliability

About the journal

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the …

$2260

Article publishing charge
for open access

87 days
Review time
96 days
Submission to acceptance

Articles

Chao-Yang Ke, Ming-Dou Ker
April 2024
Deepesh Patidar, ... Vijay Kumar Pal
April 2024
He Liu, ... Zhifeng Liu
April 2024
Kaushal Kumar Nigam, Dharmender
April 2024
Xiaomin Li, Ping Wu
April 2024
Marcel Sippel, ... Jörg Franke
April 2024View PDF
Deepanjali S., Noor Mahammad Sk
April 2024
M. Gerold, ... M. Rüb
April 2024

Calls for papers

Reliability and Failure Physics: selected papers from the ESREF 2024 Conference

Guest editors: Francesco Iannuzzo, Giovanna Mura, Paolo Cova - Submission deadline: 15 November 2024
This special issue of Microelectronics and Reliability comprises a selection of papers presented during the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2024, at Parma (Italy) from September 23rd …
Submission deadline: 15 November 2024