Vacuum Ultraviolet Spectroscopy II - 1st Edition - ISBN: 9780124759794, 9780080860220

Vacuum Ultraviolet Spectroscopy II, Volume 32

1st Edition

Editor-in-Chiefs: Thomas Lucatorto Marc De Graef
Serial Editors: James Samson David Ederer
Hardcover ISBN: 9780124759794
eBook ISBN: 9780080860220
Imprint: Academic Press
Published Date: 21st August 1998
Page Count: 307
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Table of Contents

Contributors. Volumes in the Series. Optical Systems: Monochromators and Spectrometers: M. Koike, Normal Incidence Monochromators. H.A. Padmore, M.R. Howells, and W.R. McKinney, Grazing Incidence Monochromators. J.H. Underwood, Spectrograph and Monochromators Using Varied Line Spacing Gratings. A.P. Thorne and M.R. Howells, Intermerometric Spectrometers. Detectors: J.B. West, Gas Detectors. L.R. Canfield, Photodiode Detectors. O.H.W. Siegmund, Amplifying and Position Sensitive Detectors. S.V. Bobashev, Absolute Flux Measurements. R.L. Stockbauer, Vacuum Techniques. Application: Y. Vladimirsky, Lithography. H. Ade, Spectromicroscopy. Spectroscopy: M. Ginter and K. Yoshino, Optical. T. Calcott, Fluorescence. Index.


Description

This volume is for practitioners, experimentalists, and graduate students in applied physics, particularly in the fields of atomic and molecular physics, who work with vacuum ultraviolet applications and are in need of choosing the best type of modern instrumentation. It provides first-hand knowledge of the state-of-the-art equipment sources and gives technical information on how to use it, along with a broad reference bibliography.

Readership

Experimental researchers, graduate students, and practitioners in applied physics, especially spectroscopic methods; optical sources in physics and engineering; and atomic and molecular physics who work in the field of vacuum ultraviolet applications.


Details

No. of pages:
307
Language:
English
Copyright:
© Academic Press 1998
Published:
Imprint:
Academic Press
eBook ISBN:
9780080860220

About the Editor-in-Chiefs

Thomas Lucatorto Editor-in-Chief

Affiliations and Expertise

National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.

Marc De Graef Editor-in-Chief

Affiliations and Expertise

Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.

About the Serial Editors

James Samson Serial Editor

Affiliations and Expertise

University of Nebraska, Lincoln, U.S.A.

David Ederer Serial Editor

Affiliations and Expertise

Tulane University, New Orleans, Louisiana, U.S.A.