The Growth of Electron Microscopy

The Growth of Electron Microscopy

1st Edition - July 3, 1996

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  • Editors: Tom Mulvey, Benjamin Kazan
  • eBook ISBN: 9780080577623

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Description

As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Table of Contents

  • IFSEM: V.E. Cosslett, Early History of the International Federation of Societies for Electron Microscopy. A.B. Maunsbach and G. Thomas, IFSEM 1995: Objectives, Organization, and Functions. Some Individual Societies: P.S. Turner and M. Vesk, Electron Microscopy in Australia. E.M. Horl, The Austrian Society for Electron Microscopy. H. Grumm and P. Schiske, Reminiscences of Walter Glaser. D. Van Dyck, Electron Microscopy in Belgium.G.T. Simon and F.W. Doane, The History of Electron Microscopy in Canada. Electron Microscopy in France: F. Haguenau, Early Findings in the Life Sciences. B. Jouffrey, The Development for Physics and Materials Science. H. Niedrig, The Early History of Electron Microscopy in Germany. G. Schimmel, The History of the German Society for Electron Microscopy. J. Heydenreich, H. Luppa, A. Recknagel, and D. Stiller, Electron Microscopy in the Former German Democratic Republic. S. Viragh and A. Csanady, The Hungarian Group for Electron Microscopy. U. Valdre, Electron Microscopy in Italy. The Growth of Electron Microscopy in Japan: K. Yada, Introduction. B. Tadano, The 37th Subcommittee of the Japanese Society for the Promotion of Science, 1939–1947. K. Yada, History of Electron Microscopes at Tohoku University. A. Fukami, K. Adachi, and K. Asakura, Development of Electron Microscopes at Tokyo Imperial University. K. Kanaya, Development of Electron Microscopes at the Electrotechnical Laboratory. K. Ura, Early Electron Microscopes at Osaka University, 1934–1945. Electron Microscopy in the Netherlands: W. van Iterson, Earliest Developments. P. Kruit, F.W. Schapink, J.W. Geus, A.J. Verkleij, and C.E. Hultstaert, Developments since the 1950s. A.B. Maunsbach and B.A. Afzelius, The Development of Electron Microscopy in Scandinavia. M.J. Witcomb and S.A. Wolfe-Coote, Electron Microscopy in Southern Africa.R.M. Fisher, Highlights in the Development of Electron Microscopy in the United States: A Bibliography and Commentary of Published Accounts and EMSA Records. Highlights of the IFSEM Congresses: B.A. Afzelius, Biology. J.L. Hutchison, Materials Science. P.W. Hawkes, Electron Optics. Instrumental Developments: A.W. Agar, The Story of European Commercial Electron Microscopes. G. Mollenstedt, My Early Work on Convergent-Beam Electron Diffraction. H. Hashimoto, Atom Images and IFSEM Affairs in Kyoto, Osaka, and Okayama. M. von Ardenne, Reminiscences on the Origins of the Scanning Electron Microscope and the Electron Microprobe. Microscopes and Microscopy in Japan: T. Komoda, Electron MicroscopeDevelopment at Hitachi in the 1940s. K. Ito, Development of the Electron Microscope at JEOL. S.-I. Shimadzu, Development and Application of Electron Microscopes, Model SM-1 Series, at Shimadzu Corporation. H. Kamogawa, Electron Microscope Research at the Toshiba Corporation. Y. Tashiro and A. Oyama, Development of the Electron Microscope at Kyoto Imperial University Faculty of Medicine. T. Komoda, Instrumentation. A. Ichikawa and Y. Watanabe, Application of Electron Microscopy to Biological Science. Y. Hosaka and T. Hirano, Application of Electron Microscopy to Biological Science (Microbiology). H. Fujita, Applications to Materials Science. K. Yada, Specimen Preparation Techniques. F. Lenz, Towards Atomic Resolution. L.Y. Huang, The Construction of Commercial Electron Microscopes in China. Appendix: P.W. Hawkes, Conference Proceedings and Conference Abstracts. Subject Index.

Product details

  • No. of pages: 885
  • Language: English
  • Copyright: © Academic Press 1996
  • Published: July 3, 1996
  • Imprint: Academic Press
  • eBook ISBN: 9780080577623

About the Serial Editors

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.

Benjamin Kazan

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

About the Editor in Chief

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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