Statistical Aspects of Quality Control - 1st Edition - ISBN: 9781493300365, 9780080572345

Statistical Aspects of Quality Control

1st Edition

Print ISBN: 9781493300365
eBook ISBN: 9780080572345
Imprint: Academic Press
Published Date: 23rd October 1996
Page Count: 200

Institutional Access


On-line and off-line quality control are the two methods used to discern a products reliability of quality. Though they are disparate techniques, both methods are used to achieve the same result. This introductory textbook integrates the two techniques to present a wide coverage of statistical methods of quality control. The text is compact, stressing the key ideas and concepts rather than trying to cover each method in complete depth. Statistical Aspects of Quality Control is an excellent starting point for a student interested in learning more about the field of statistical quality control. References and suggested readings are included at the end of each chapter.

Key Features

  • Presents statistical quality control in a compact fashion that stresses key ideas and concepts
  • Uses the concept of Average Run Length to compare the different control charts, such as Shewhart, moving average, and cusum
  • Introduces the Taguchi approach to quality design
  • Includes information on acceptance sampling
  • Concludes each chapter with final comments, references, and examples to illustrate the methods discussed


Students in statistics and business, Industrial Engineers, Operations Researchers, statisticians, Quality Engineers

Table of Contents

Introduction. Elements of Probability. Statistical Inference. Off-Line Quality Control. Shewhart Control Charts. More General Control Charts. Sampling Inspection by Attributes. Sampling Inspection by Variables--A Loss FunctionApproach. Subject Index.


No. of pages:
© Academic Press 1997
Academic Press
eBook ISBN:
Hardcover ISBN:
Paperback ISBN:


"The book is well written and easy to follow." -Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN "...the book is useful to both statistician and nonstatistician audiences..." -Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS