Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123942982, 9780123946362

Advances in Imaging and Electron Physics, Volume 174

1st Edition

Silicon-Based Millimetre-wave Technology

Serial Volume Editors: Jamal Deen
eBook ISBN: 9780123946362
Hardcover ISBN: 9780123942982
Imprint: Academic Press
Published Date: 27th November 2012
Page Count: 484
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Table of Contents



Future Contributions




Permission Acknowledgments

Chapter One. Measurement Techniques and Issues

1. Introduction

2. Overview of Measurement Methods and Instrumentation

3. Transmission Line and S-Parameters

4. Millimeter-Wave Network Analyzers

5. Cascading of S-Parameters and Transmission/Transfer T-Parameters

6. Calibration and De-Embedding at MM-Waves


Chapter Two. Transmission Lines and Passive Components

1. Introduction

2. Silicon Integrated Circuits and Technology

3. Transmission Lines

4. Electromagnetics of Transmission Lines and Their Discontinuities

5. Transitions

6. Capacitors, Inductors, and Resistors

7. Resonators and Filters for Silicon Integrations of Increased Frequencies

8. Power Dividers And Directional Couplers for SI-Integrated Circuits

9. Packaging of Millimeter-Wave Components and Chips

10. Conclusions


Chapter Three. Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping

1. Introduction to Artificial Neural Networks

2. Structure of Artificial Neural Networks

3. Activation Functions

4. Aspects of Artificial Neural Network Training

5. Applications of Artificial Neural Networks to Modeling of on-Chip High-Frequency Devices

6. Introduction to Space Mapping

7. The Space Mapping Concept

8. The Parameter Extraction Step

9. Space Mapping Approaches

10. Space Mapping Optimization and Modeling

11. Applications of Space Mapping

12. Conclusions


Chapter Four. Nanoscale FETs

1. Types and Performances of Nanoscale MOSFETs

2. Small-Signal Analysis of MOSFETs at High Frequencies



Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


No. of pages:
© Academic Press 2012
Academic Press
eBook ISBN:
Hardcover ISBN:

Ratings and Reviews

About the Serial Volume Editors

Jamal Deen Serial Volume Editor

Affiliations and Expertise

McMaster University, Hamilton, Ontario, Canada