With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation.

Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems.

Key Features

* Introduces reliability theory and the importance of maintainability * Presents coding and the construction of several error detecting and correcting codes * Discusses in depth, the available techniques for fail-safe design of combinational circuits * Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits * Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design

Table of Contents

Chapter 1 - Fundamentals of Reliability 1.1 Reliability and Failure Rate 1.2 Relation between Reliability and Mean-Time-Between-Failures 1.3 Maintainability 1.4 Availability 1.5 Series and Parallel Systems 1.6 Dependability References Chapter 2 - Error Detecting and Correcting Codes 2.1 Parity Code 2.2 Multiple Error Detecting Codes 2.2.1 Unordered Codes for Unidirectional Error Detection m-out-of-n Codes Berger Code 2.2.2 t-unidirectional Error Detecting Codes Borden Code Bose-Lin Codes 2.2.3 Burst Unidirectional Error Detecting Code 2.3 Residue Codes 2.4 Cyclic Codes 2.5 Error-Correcting Codes 2.5.1 Hamming Code 2.5.2 Hsiao Code 2.5.3 Reed-Solomon Code References Chapter 3 - Self-Checking Combinational Logic Design 3.1 Strongly Fault-secure Circuits 3.2 Strongly Code-disjoint Circuits 3.3 Terminology 3.4 Bidirectional Error Free Combinational Circuit Design


No. of pages:
© 2000
Morgan Kaufmann
Print ISBN:
Electronic ISBN:

About the editor

Parag Lala

The author is currently a Professor in the Department of Electrical Engineering at North Carolina A&T State University. He is the author of more than 75 papers, and three books published by Prentice Hall. His research interests include design for testability, self-checking logic design, automatic logic synthesis of low power logic circuits, andCPLD/FPGA based system design. He received a M.S. from King's College, London, and a Ph.D. from the City University of London.

Affiliations and Expertise

North Carolina Agricultural and Technical State University