Scanning Tunneling Microscopy

1st Edition

Editor-in-Chiefs: Thomas Lucatorto Marc De Graef
Editors: Joseph Stroscio William Kaiser
Paperback ISBN: 9780126740509
eBook ISBN: 9781483292878
Imprint: Academic Press
Published Date: 29th September 1994
Page Count: 459
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Table of Contents

Contributors Preface List of Volumes in Treatise

  1. Theory of Scanning Tunneling Microscopy. by J. Tersoff and N.D. Lang 1.1 Basic Principles 1.2 Theory of STm Imaging 1.3 Metal Surfaces: STM as Surface Topography 1.4 Semiconducting Surfaces: Role of Surface Electronic Structure 1.5 Adsorbates on Metal Surfaces 1.6 Close Approach of the Tip: The Strong-Coupling Regime 1.7 Tunneling Spectroscopy 1.8 Mechanical Tip-Sampling Interactions

  2. Design Considerations for an STM System.
    by S.-I. Park and R.C. Barrett 2.1 Introduction 2.2 Thworetical Considerations 2.3 Mechanical Structure and Components 2.4 Control Electronics 2.5 Common Problems and Further Improvements Acknowledgments References

  3. Extensions of STM. by H.K. Wickramasinghe 3.1 Introduction 3.2 Historical 3.3 STM and Some Extensions 3.4 Near-Field Thermal Microscopy and Extensions 3.5 Scanning Force Microscopy and Applications 3.6 Conclusion References

  4. Methods of Tunneling Spectroscopy.
    by J.A. Stroscio and R.M.Feenstra 4.1 Instrumentation 4.2 General Current versus Voltage Characteristics 4.3 Voltage-Dependent Imaging Measurements 4.4 Fixed Separation I-V Measurements 4.5 Variable Separation Measurements References

  5. Semiconductor Surfaces. 5.1 Silicon by R. Becker and R. Wolkow,<BR id


Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.


Graduate students in physical science and engineering, especially surface science.


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© Academic Press 1993
Academic Press
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About the Editor-in-Chiefs

Thomas Lucatorto Editor-in-Chief

Affiliations and Expertise

National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.

Marc De Graef Editor-in-Chief

Affiliations and Expertise

Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.

About the Editors

Joseph Stroscio Editor

Affiliations and Expertise

National Institute of Standards and Technology

William Kaiser Editor

Affiliations and Expertise

Jet Propulsion Laboratory