List of Volumes in Treatise
1. Theory of Scanning Tunneling Microscopy.
by J. Tersoff and N.D. Lang
1.1 Basic Principles
1.2 Theory of STm Imaging
1.3 Metal Surfaces: STM as Surface Topography
1.4 Semiconducting Surfaces: Role of Surface Electronic Structure
1.5 Adsorbates on Metal Surfaces
1.6 Close Approach of the Tip: The Strong-Coupling Regime
1.7 Tunneling Spectroscopy
1.8 Mechanical Tip-Sampling Interactions
2. Design Considerations for an STM System.
by S.-I. Park and R.C. Barrett
2.2 Thworetical Considerations
2.3 Mechanical Structure and Components
2.4 Control Electronics
2.5 Common Problems and Further Improvements
3. Extensions of STM.
by H.K. Wickramasinghe
3.3 STM and Some Extensions
3.4 Near-Field Thermal Microscopy and Extensions
3.5 Scanning Force Microscopy and Applications
4. Methods of Tunneling Spectroscopy.
by J.A. Stroscio and R.M.Feenstra
4.2 General Current versus Voltage Characteristics
4.3 Voltage-Dependent Imaging Measurements
4.4 Fixed Separation I-V Measurements
4.5 Variable Separation Measurements
5. Semiconductor Surfaces.
by R. Becker and R. Wolkow,
- No. of pages:
- © 1993
29th September 1994
- Print ISBN:
- Electronic ISBN: