Description

Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.

Readership

Graduate students in physical science and engineering, especially surface science.

Table of Contents

Contributors Preface List of Volumes in Treatise 1. Theory of Scanning Tunneling Microscopy. by J. Tersoff and N.D. Lang 1.1 Basic Principles 1.2 Theory of STm Imaging 1.3 Metal Surfaces: STM as Surface Topography 1.4 Semiconducting Surfaces: Role of Surface Electronic Structure 1.5 Adsorbates on Metal Surfaces 1.6 Close Approach of the Tip: The Strong-Coupling Regime 1.7 Tunneling Spectroscopy 1.8 Mechanical Tip-Sampling Interactions References 2. Design Considerations for an STM System. by S.-I. Park and R.C. Barrett 2.1 Introduction 2.2 Thworetical Considerations 2.3 Mechanical Structure and Components 2.4 Control Electronics 2.5 Common Problems and Further Improvements Acknowledgments References 3. Extensions of STM. by H.K. Wickramasinghe 3.1 Introduction 3.2 Historical 3.3 STM and Some Extensions 3.4 Near-Field Thermal Microscopy and Extensions 3.5 Scanning Force Microscopy and Applications 3.6 Conclusion References 4. Methods of Tunneling Spectroscopy. by J.A. Stroscio and R.M.Feenstra 4.1 Instrumentation 4.2 General Current versus Voltage Characteristics 4.3 Voltage-Dependent Imaging Measurements 4.4 Fixed Separation I-V Measurements 4.5 Variable Separation Measurements References 5. Semiconductor Surfaces. 5.1 Silicon by R. Becker and R. Wolkow,

Details

No. of pages:
459
Language:
English
Copyright:
© 1993
Published:
Imprint:
Academic Press
Print ISBN:
9780126740509
Electronic ISBN:
9781483292878