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Scanning Tunneling Microscopy - 1st Edition - ISBN: 9780126740509, 9781483292878

Scanning Tunneling Microscopy

1st Edition

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Editors: Joseph Stroscio William Kaiser
Editors in Chief: Thomas Lucatorto Marc De Graef
eBook ISBN: 9781483292878
Imprint: Academic Press
Published Date: 29th September 1994
Page Count: 459
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Table of Contents

Contributors Preface List of Volumes in Treatise

  1. Theory of Scanning Tunneling Microscopy. by J. Tersoff and N.D. Lang

  2. 1 Basic Principles

  3. 2 Theory of STm Imaging

  4. 3 Metal Surfaces: STM as Surface Topography

  5. 4 Semiconducting Surfaces: Role of Surface Electronic Structure

  6. 5 Adsorbates on Metal Surfaces

  7. 6 Close Approach of the Tip: The Strong-Coupling Regime

  8. 7 Tunneling Spectroscopy

  9. 8 Mechanical Tip-Sampling Interactions

  10. Design Considerations for an STM System.
    by S.-I. Park and R.C. Barrett

  11. 1 Introduction

  12. 2 Thworetical Considerations

  13. 3 Mechanical Structure and Components

  14. 4 Control Electronics

  15. 5 Common Problems and Further Improvements Acknowledgments References

  16. Extensions of STM. by H.K. Wickramasinghe

  17. 1 Introduction

  18. 2 Historical

  19. 3 STM and Some Extensions

  20. 4 Near-Field Thermal Microscopy and Extensions

  21. 5 Scanning Force Microscopy and Applications

  22. 6 Conclusion References

  23. Methods of Tunneling Spectroscopy.
    by J.A. Stroscio and R.M.Feenstra

  24. 1 Instrumentation

  25. 2 General Current versus Voltage Characteristics

  26. 3 Voltage-Dependent Imaging Measurements

  27. 4 Fixed Separation I-V Measurements

  28. 5 Variable Separation Measurements References

  29. Semiconductor Surfaces.

  30. 1 Silicon by R. Becker and R. Wolkow, References

  31. 2 Germanium by R. Becker References

  32. 3 Gallium Arsenide by R. M. Feenstra and J. A. Strocio References

  33. Metal Surfaces. by Y. Kuk

  34. 1 Introduction

  35. 2 Corrugation Amplitudes and the Tunneling Tip

  36. 3 Tunneling Spectroscopy of Metal Surfaces

  37. 4 Clean Metal Surfaces

  38. 5 Adsorbate on Metal Surfaces

  39. 6 Conclusion Acknowledgment References

  40. Ballistic Electron Emission Microscopy. by L.D. Bell, W.J. Kaiser, M.H. Hecht, and L.C. Davis

  41. 1 Introduction

  42. 2 Theory

  43. 3 Experimental Details

  44. 4 Results

  45. 5 Conclusions Acknowledgment References

8 Charge-Density Waves. by R.V. Coleman, Z. Dai, W.W.McNairy, C.G. Slough, and C. Wang 8.1 Transition Metal Chalcogenides 8.2 Charge-Density Wave Formation 8.3 Charge-Density Wave in Transition Metal Chalcogenides 8.4 Experimental STM and AFM Response to CDW Structures 8.5 Experimentsl Techniques 8.6 1T Phase Transition Metal Dichalcogenides 8.7 2H Phase Transition Metal Dichalcogenides 8.8 4Hb Phase Transition Metal Dichalcogenides 8.9 Linear Chain Transition Metal Traichalcogenides 8.10 Conclusions Acknowledgments References

  1. Superconductors by H.F. Hess
  2. 1 Introduction
  3. 2 The Superconducting State
  4. 3 Experimentsl Techniques for STM on Superconductors
  5. 4 Spectrum in Zero Fiels
  6. 5 Vortex Data
  7. 6 Interpretation
  8. 7 Conclusion References



Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.


Graduate students in physical science and engineering, especially surface science.


No. of pages:
© Academic Press 1993
29th September 1994
Academic Press
eBook ISBN:

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About the Editors

Joseph Stroscio

Affiliations and Expertise

National Institute of Standards and Technology

William Kaiser

Affiliations and Expertise

Jet Propulsion Laboratory

About the Editors in Chief

Thomas Lucatorto

Affiliations and Expertise

National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.

Marc De Graef

Affiliations and Expertise

Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.