Reliability, Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices

Methodology and Evaluation

1st Edition - September 23, 2016

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  • Authors: Yannick Deshayes, Laurent Béchou
  • Hardcover ISBN: 9781785481529
  • eBook ISBN: 9780081010884

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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.  

Key Features

  • Deals exclusively with reliability, based on the physics of failure for infrared LEDs
  • Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
  • Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
  • Focuses on the method to extract fundamental parameters from electrical and optical characterizations


Practitioners and engineers, small and mid-sized enterprises; postgraduate students, academics, and researchers

Table of Contents

    • Preface
    • 1: State-of-the-Art of Infrared Technology
      • Abstract
      • 1.1 Introduction
      • 1.2 Compound materials III-V
      • 1.3 Light-emitting diodes
      • 1.4 Applications
      • 1.5 Conclusion
    • 2: Analysis and Models of an LED
      • Abstract
      • 2.1 Introduction
      • 2.2 Physicochemical analysis
      • 2.3 Electro-optical analysis
      • 2.4 Initial characterizations of 935 nm LEDs
      • 2.5 Conclusion
    • 3: Physics of Failure Principles
      • Abstract
      • 3.1 Introduction
      • 3.2 Aging tests
      • 3.3 Failure signatures
      • 3.4 Physics of failures
      • 3.5 Conclusion
    • 4: Methodologies of Reliability Analysis
      • Abstract
      • 4.1 Introduction
      • 4.2 Method based on the physics of failures
      • 4.3 Digital methods
      • 4.4 A new approach
      • 4.5 Conclusion
    • Bibliography
    • Index

Product details

  • No. of pages: 172
  • Language: English
  • Copyright: © ISTE Press - Elsevier 2016
  • Published: September 23, 2016
  • Imprint: ISTE Press - Elsevier
  • Hardcover ISBN: 9781785481529
  • eBook ISBN: 9780081010884

About the Authors

Yannick Deshayes

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..

Affiliations and Expertise

Associate Professor, University of Bordeaux, France

Laurent Béchou

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Affiliations and Expertise

Université de Sherbrooke

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