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Reliability of Semiconductor Lasers and Optoelectronic Devices - 1st Edition - ISBN: 9780128192542

Reliability of Semiconductor Lasers and Optoelectronic Devices

1st Edition

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Editors: Robert Herrick Osamu Ueda
Paperback ISBN: 9780128192542
Imprint: Woodhead Publishing
Published Date: 1st March 2021
Page Count: 300
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Table of Contents

1. Introduction to optoelectronic devices

Robert W. Herrick and Qiang Guo

2. Introduction to reliability concepts

Robert W. Herrick

3. Case studies in Optoelectronics Reliability

Robert W. Herrick

4. Material Science of defects in semiconductor lasers

Kunal Muhkerjee

5. Grown-in defects affecting the reliability of lasers III-V's vs GaN-related compounds

Osamu Ueda and Shigetaka Tomiya

6. Reliability of lasers on silicon substrates for silicon photonics

Justin Norman, Daehwan Jung, Alan Liu, John Edward Bowers, Robert W. Herrick and Kunal Muhkerjee

7. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs

Carlo De Santi, Matteo Meneghini, Alessandro Caria, Francesco Piva, Gaudenzio Meneghesso and Enrico Zanoni


Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability through a focus on case studies and structured methods. The book provides a brief look at the fundamentals of laser diodes and presents real world case studies that discuss the principles of reliability and what occurs when rules are broken. In addition, the book comprehensively looks at optoelectronics devices and their reliability principles to avoid the most common failure mechanisms and presents key materials and devices, including silicon photonics, high power laser diodes, VCSELS, InGaN LEDs and Lasers, and AlGaN LEDs, and more.

Key Features

  • Includes case studies and numerous examples of best practices and common mistakes that impact optoelectronics reliability
  • Reviews key failure mechanisms that impact reliability, including degradation and grown-in defects
  • Provides a look at reliability issues for silicon photonics, VCSELS, InGaN LEDs and lasers, AIGaN LEDs, and more


Materials Scientists and Electrical Engineers primarily working in R&D, secondary audience in academia


No. of pages:
© Woodhead Publishing 2021
1st March 2021
Woodhead Publishing
Paperback ISBN:

Ratings and Reviews

About the Editors

Robert Herrick

Dr. Herrick is one of the world’s leading authorities in semiconductor laser reliability and failure analysis, with over 25 years of experience in the field. After receiving his MSEE from the University of Illinois, he worked as a designer and process developer on many of the earliest record breaking integrated photonics devices in the late 1980’s and early 1990’s. He did his Ph.D. research at UCSB in the mid 1990’s, doing the first research on VCSEL reliability and failure analysis. After graduating, he worked for many of the largest optoelectronic transceiver providers, primarily in VCSEL reliability and failure analysis, but also in roles in fiber optic module reliability. These companies included HP/Agilent, Emcore, and JDSU. He also worked for Finisar developing one of the first 10Gbps AlGaInAs-based 1.3um lasers for Datacom applications. In his most recent role, he played a key role in qualifying the world’s first high-volume silicon photonic with embedded hybrid lasers. He has also collaborated with UCSB on developing the first reliable quantum dot lasers grown directly on silicon substrates, and has recently given many invited talks on the breakthroughs in this field.

Affiliations and Expertise

Sr. Staff Engineer, Intel Corporation, USA

Osamu Ueda

Dr. and Prof. Osamu Ueda received B.S. and PhD degrees from University of Tokyo in 1974 and 1990, respectively. He joined Fujitsu Laboratories Ltd. in 1974. Since then, his research has been focused on evaluation of defects and microstructures in various semiconducting materials and degradation mechanism of compound semiconductor optical devices such as semiconductor lasers and LEDs for over 30 years. The key technique of his work is transmission electron microscopy (TEM) for characterization of defects in semiconductors and degraded optical devices. During this term, he joined the department of materials science and engineering at MIT as a visiting scientist in ’84-’86. He was also a visiting associate Professor at Hokkaido University in ’92-‘93, a visiting Professor at Kyushu University in ’02-‘03, and a visiting Professor at Kanazawa Institute of Technology in ’99-’05. He is currently a Professor at the Graduate School of Engineering at Kanazawa Institute of Technology, Tokyo, Japan, which he joined in 2005. He is also a Professor at the Research Laboratory for Integrated Technological Systems, Hakusan, Ishikawa prefecture, Japan. He authored more than 150 scientific papers including 30 invited papers, three books, and 56 patents. Ueda has chaired and organized a number of international scientific meetings including several MRS symposia in the Spring and Fall Meetings on Reliability and Materials Issues in Semiconductor Optical and Electron Devices and Materials. He has also served as a meeting chair of 2016 MRS Spring Meeting in Phoenix. He has been a head editor of Japanese Journal of Applied Physics (JJAP) in ’97-’10 and an Editor-in-Chief of JJAP in ’04-’05, respectively.

Affiliations and Expertise

Meiji University