Description

Related Annealing Phenomena fulfils the information needs of materials scientists in both industry and academia. The subjects treated in the book are all active research areas, forming a major part of at least four regular international conference series. This new 2nd edition ensures the reader has access to the latest findings, essential to those working at the forefront of research in universities and laboratories. For those in industry, the book highlights applications of the research and technologically important examples. In particular, the 2nd edition builds on the significant progress made recently in the following key areas: Deformed state, including deformation to very large strains Characterisation of microstructures by electron backscatter diffraction (EBSD) Modelling and simulation of annealing. Continuous recrystallization.

Key Features

* Fully revised and up-to-date, the 2nd edition highlights the significant progress made recently in this important area of research * Detailed coverage, much more comprehensive treatment than is found in textbooks on physical metallurgy bridges the gap between theory and practice by examining the application of quantitative, physically based models to metal forming processes

Table of Contents

Introduction; the deformed state; deformation textures; the structure and energy of grain boundaries; the mobility and migration of boundaries; recovery after deformation; recrystallization of single-phase alloys; recrystallization of ordered materials; recrystallization of two-phase alloys; the growth and stability of cellular microstructures; grain growth following recrystallization recrystallization textures; hot deformation and dynamic restoration; continuous recrystallization during and after large strain deformation; control of recrystallization; computer modeling and simulation of annealing

Details

No. of pages:
658
Language:
English
Copyright:
© 2004
Published:
Imprint:
Pergamon
Electronic ISBN:
9780080540412
Print ISBN:
9780080441641
Print ISBN:
Print ISBN:
9780444561732

About the authors