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Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more.
The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.
- Includes authoritative coverage of the fundamental theory behind electron beams
- Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques
- Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Materials scientists and engineers, electronic engineers, applied physicists, electron microscopists
Part XI – Wave Mechanics
55. The Schrödinger Equation
56. The Relativistic Wave Equation
57. The Eikonal Approximation
58. Paraxial Wave Optics
59. The General Theory of Electron Diffraction and Interference
60. Elementary Diffraction Patterns
Part XII, Electron Interference and Electron Holography
61. General Introduction
Part XIII, Theory of Image Formation
64. General Introduction
65. Fundamentals of Transfer Theory
66. The Theory of Bright-field Imaging.
67. Image Formation in the Scanning Transmission Electron Microscope
68. Statistical Parameter Estimation Theory
Part XIV – Electron–specimen Interactions
69. Electron Interactions in Thin Specimens
Part XV – Digital Image Processing
71. Acquisition, Sampling and Coding
73. Linear Restoration
74. Nonlinear Restoration – the Phase Problem
75. Three-dimensional Reconstruction
76. Image Analysis
77. Microscope Parameter Measurement and Instrument Control
Part XVI – Coherence, Brightness and Spectral Functions
78. Coherence and the Brightness Functions
79. Wigner Optics
PART XVII – Vortex Studies, the Quantum Electron Microscope
80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope
- No. of pages:
- © Academic Press 2021
- 1st October 2021
- Academic Press
- Paperback ISBN:
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)
Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).
Institute of Applied Physics, University of Tuebingen, Tuebingen, Germany
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