Practical Fourier Transform Infrared Spectroscopy

Practical Fourier Transform Infrared Spectroscopy

Industrial and laboratory chemical analysis

1st Edition - December 28, 1989

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  • Editor: John R. Ferraro
  • eBook ISBN: 9780323146401

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Description

Practical Fourier Transform Infrared Spectroscopy: Industrial and Laboratory Chemical Analysis presents the Fourier Transform Infrared Spectroscopy (FT-IR) as a valuable analytic tool in solving industrial and laboratory chemical problems. The text provides chapters that deal with the various applications of FT-IR such as the characterization of organic and inorganic superconductors; the study of forensic materials such as controlled drug particles, fragments of polymers, textile fibers, and explosives; identification and quantification of impurities and measurement of epitaxial thickness in silicon; bulk and surface studies and microanalyses of industrial materials; and the identification or determination of unknown compounds. Chemists, industrial researchers, and product engineers will find the book useful.

Table of Contents


  • Contributors

    Preface

    Acknowledgments

    1. The Use of Vibrational Spectroscopy in the Characterization of High-Critical-Temperature Ceramic Superconductors

    I. Structural Considerations and Group Theory

    II. Methods for Infrared and Raman Measurements

    III. Vibrational Spectroscopy of La2_xMxCuO4

    IV. Vibrational Spectroscopy of ABa2Cu3O7_x

    V. Concluding Remarks

    References

    2. The Use of Vibrational Spectroscopy in the Characterization of Synthetic Organic Electrical Conductors and Superconductors

    I. Organic Charge-Transfer Conductors and Superconductors

    II. Polymer-Salt Complexes

    III. Transition Element-Macrocyclic Ligand Complexes

    IV. Organic Polymers: Polyacetylene

    V. FT-IR Microspectroscopy of Synthetic Electrical Conductors

    References

    3. FT-IR Microsampling Techniques

    I. Introduction

    II. Experimental Considerations

    III. Applications

    IV. Conclusion

    References

    4. Possibilities and Limitations of FT-Raman Spectroscopy

    I. Introduction

    II. Principles

    III. Instrumentation

    IV. Applications and Limitations

    V. Prospects

    References

    5. Vibrational Circular Dichroism: Comparison of Techniques and Practical Considerations

    I. Introduction

    II. Experimental Design

    III. Current Experimental Capabilities

    IV. Example Application: VCD of Polypeptides and Proteins

    References

    6. Characterization of Semiconductor Silicon Using Fourier Transform Infrared Spectroscopy

    I. Introduction

    II. Characterization of Interstitial Oxygen and Substitutional Carbon in Silicon

    III. Nitrogen in Silicon

    IV. Hydrogen in Silicon

    V. Shallow Impurities in Silicon

    VI. Radiation Damage

    VII. Epitaxial Thickness Measurements

    VIII. Quantitative Measurements on Passivation Layers

    IX. Conclusion

    References

    7. Industrial Applications of FT-IR

    I. Introduction

    II. Microanalysis by FT-IR Microscopy

    III. Surface Analysis

    IV. Bulk Analysis

    V. Summary

    References

    8. Multivariate Calibration Methods Applied to Quantitative FT-IR Analyses

    I. Introduction

    II. Experimental Aspects of Quantitative FT-IR Analyses

    III. Univariate versus Multivariate Calibration

    IV. Classical Least-Squares Calibration

    V. q-Matrix Method

    VI. Inverse Least-Squares Method

    VII. Factor Analysis Methods

    VIII. Cross-Correlation and Kalman Filter Methods

    IX. Variations in Multivariate Calibration Methods

    X. Error Analysis, Diagnostics, and Outlier Detection

    XI. Applications

    XII. Summary

    References

    9. Industrial Applications of GC/FT-IR

    I. Introduction

    II. Development of GC/IR

    III. Outline of Apparatus

    IV. Basic Features of GC/FT-IR Spectra

    V. Applications

    VI. Conclusion

    References

    Index

Product details

  • No. of pages: 548
  • Language: English
  • Copyright: © Academic Press 1989
  • Published: December 28, 1989
  • Imprint: Academic Press
  • eBook ISBN: 9780323146401

About the Editor

John R. Ferraro

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