Plasma Diagnostics

Plasma Diagnostics

Surface Analysis and Interactions

1st Edition - February 28, 1989

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  • Editors: Orlando Auciello, Daniel Flamm
  • eBook ISBN: 9781483288079

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Description

Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Plasmas are used in microelectronics to process semiconductors (etching of patterns for microcircuits, plasma-induced deposition of thin films, etc.); plasmas produce deleterious erosion effects on surfaces of materials used for fusion devices and spaceships exposed to the low earth environment.Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.short version, TJE_Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.

Readership

Scientists and engineers who work with plasma in microelectronics, fusion, and space technology; graduate students in these areas.

Table of Contents

  • OF VOLUME 2: J.W. Coburn, Quartz Crystal Microbalances for Studies of Plasma-Surface Interactions. D.L. Smith, H.P. Gillis, and T.M. Mayer, Elemental Analysis of Treated Surfaces. D.E. Aspnes and R.P.H. Chang, Spectroscopic Ellipsometry in Plasma Processing. B.L. Doyle and W.-K. Chu, Ion Beam Analysis of Plasma-Exposed Surfaces. P.C. Stangeby, The Interpretation of Plasma Probes for Fusion Experiments. B.K. Bein and J. Pelzl, Analysis of Surfaces Exposed to Plasmas by Non-Destructive Photoacoustic and Photothermal Techniques.

Product details

  • No. of pages: 337
  • Language: English
  • Copyright: © Academic Press 1989
  • Published: February 28, 1989
  • Imprint: Academic Press
  • eBook ISBN: 9781483288079

About the Editors

Orlando Auciello

Affiliations and Expertise

Microelectronics Center of North Carolina and North Carolina University

Daniel Flamm

Affiliations and Expertise

AT&T Bell Laboratories, Murray Hill, New Jersey

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