Particle Beam Physics

Particle Beam Physics

1st Edition - October 20, 1998

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  • Editors: Tom Mulvey, Benjamin Kazan
  • eBook ISBN: 9780080577715

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Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Table of Contents

  • A. Åström and R. Forchheimer, Near-Sensor Image Processing. E. Oho, Digital Image Processing Technology for Scanning Electron Microscopy. H. Suzuki, Electron Gun Systems for Color CRTs. E. Yamazaki, Design and Performance of Shadow-Mask Color CRTs. Subject Index.

Product details

  • No. of pages: 416
  • Language: English
  • Copyright: © Academic Press 1998
  • Published: October 20, 1998
  • Imprint: Academic Press
  • eBook ISBN: 9780080577715

About the Serial Editors

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.

Benjamin Kazan

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

About the Editor in Chief

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

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