Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Table of Contents
A. Åström and R. Forchheimer, Near-Sensor Image Processing. E. Oho, Digital Image Processing Technology for Scanning Electron Microscopy. H. Suzuki, Electron Gun Systems for Color CRTs. E. Yamazaki, Design and Performance of Shadow-Mask Color CRTs. Subject Index.
@from:Praise for the Series
@qu:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
@qu:"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
@source:--J.A. Chapman in LABORATORY PRACTICE
Elsevier.com visitor survey
We are always looking for ways to improve customer experience on Elsevier.com. We would like to ask you for a moment of your time to fill in a short questionnaire, at the end of your visit.
If you decide to participate, a new browser window will open and remain open until you have completed your visit to this website.