Partial Cumulative Index

Partial Cumulative Index

Cumulative Index

1st Edition - October 13, 1997

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  • Editor-in-Chief: Peter Hawkes
  • eBook ISBN: 9780080577661

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Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Volume 100 is a cumulative index for all in-print volumes of Advances in Electronics and Electron Physics (Volumes 63–89), Advances in Imaging & Electron Physics (Volumes 90–99), and Advances in Optical & Electron Microscopy(Volumes 1–14).

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Table of Contents

  • Cumulative index for all in-print volumes of:
    Advances in Electronics and Electron Physics, Volumes 63-89
    Advances in Imaging & Electron Physics, Volumes 90-99
    Advances in Optical & Electron Microscopy, Volumes 1-14

Product details

  • No. of pages: 224
  • Language: English
  • Copyright: © Academic Press 1997
  • Published: October 13, 1997
  • Imprint: Academic Press
  • eBook ISBN: 9780080577661

About the Editor in Chief

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics

About the Serial Editors

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.

Benjamin Kazan

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

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