Optoelectronic Devices: III Nitrides - 1st Edition - ISBN: 9780080444260, 9780080538112

Optoelectronic Devices: III Nitrides

1st Edition

Authors: Mohamed Henini M Razeghi
eBook ISBN: 9780080538112
Hardcover ISBN: 9780080444260
Imprint: Elsevier Science
Published Date: 17th December 2004
Page Count: 592
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Description

Tremendous progress has been made in the last few years in the growth, doping and processing technologies of the wide bandgap semiconductors. As a result, this class of materials now holds significant promis for semiconductor electronics in a broad range of applications.

The principal driver for the current revival of interest in III-V Nitrides is their potential use in high power, high temperature, high frequency and optical devices resistant to radiation damage.

This book provides a wide number of optoelectronic applications of III-V nitrides and covers the entire process from growth to devices and applications making it essential reading for those working in the semiconductors or microelectronics.

Key Features

  • Broad review of optoelectronic applications of III-V nitrides

Readership

Academic and industrial researchers in semiconductors and micro-electronics

Details

No. of pages:
592
Language:
English
Copyright:
© Elsevier Science 2005
Published:
Imprint:
Elsevier Science
eBook ISBN:
9780080538112
Hardcover ISBN:
9780080444260

About the Author

Mohamed Henini

Dr M. Henini has over 20 years’ experience of Molecular Beam Epitaxy (MBE) growth and has published >700 papers. He has particular interests in the MBE growth and physics of self-assembled quantum dots using electronic, optical and structural techniques. Leaders in the field of self-organisation of nanostructures will give an account on the formation, properties, and self-organization of semiconductor nanostructures.

Affiliations and Expertise

The University of Nottingham, School of Physics and Astronomy, UK

M Razeghi

Affiliations and Expertise

Director, Center for Quantum Devices, Department of Electrical and Computer Engineering, Northwestern University, USA