Optical Characterization of Semiconductors

Optical Characterization of Semiconductors

Infrared, Raman, and Photoluminescence Spectroscopy

1st Edition - August 31, 1993

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  • Author: Sidney Perkowitz
  • eBook ISBN: 9780080984278

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.

Key Features

Discusses and compares infrared, Raman, and photoluminescence methods
Enables readers to choose the best method for a given problem
Illustrates applications to help non-experts and industrial users, with answers to selected common problems
Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion
Features equipment lists and discussion of techniques to help establish characterization laboratories


Graduate students, researchers, and engineers involved in materials science, semiconductor physics, and optics.

Table of Contents

  • Introduction. Optical Theory for Semiconductor Characterization. Optical Physics of Semiconductors. Measurement Methods. Case Studies: Photoluminescence Characterization. Case Studies: Raman Characterization. Case Studies: Infrared Characterization. Summary and Future Trends. References. Subject Index.

Product details

  • No. of pages: 220
  • Language: English
  • Copyright: © Academic Press 1993
  • Published: August 31, 1993
  • Imprint: Academic Press
  • eBook ISBN: 9780080984278

About the Author

Sidney Perkowitz

Affiliations and Expertise

Emory University

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