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Non-Crystalline Films for Device Structures
1st Edition, Volume 29 - November 28, 2001
Editors: Maurice H. Francombe, Stephen M. Rossnagel, Abraham Ulman, V. M. Agranovich
Language: English
eBook ISBN:9780080542959
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Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the proper…Read more
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Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems. In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical and their technological aspects. Volume 29 consists of chapters pulled from Hari Singh Nalwa's forthcoming Handbook of Thin Film Materials (ISBN: 0-12-512908-4). The chapters were selected because they deal exclusively with amorphous film structures and because they have a common relevance to semiconductor, or electronic, devices and circuits. These are subjects not yet stressed in the Thin Films series.
Thin film and surface science researchers in chemistry, materials science, electrical engineering, biology, and condensed matter physics.
No. of pages: 265
Language: English
Edition: 1
Volume: 29
Published: November 28, 2001
Imprint: Academic Press
eBook ISBN: 9780080542959
MF
Maurice H. Francombe
Affiliations and expertise
Georgia State University, Atlanta, U.S.A.
SR
Stephen M. Rossnagel
Affiliations and expertise
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, New York, U.S.A.
AU
Abraham Ulman
Affiliations and expertise
Polytechnic University, Brooklyn, New York, U.S.A.
VA
V. M. Agranovich
Affiliations and expertise
Russian Academy of Sciences, Moscow, Russia
Read Non-Crystalline Films for Device Structures on ScienceDirect