Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Table of Contents

Dynamics. Beams and Beam Physics. Differential Equations, Determinism, and Maps. Lagrangian Systems. Hamiltonian Systems. Electrodynamics. Differential Algebraic Techniques. Function Spaces and their Algebras. Taylor Differential Algebras. Advanced Methods. Fields. Analytic Field Representation. Practical Utilization of Field Information. Maps: Calculation. The Particle Optical Equations of Motion. Equations of Motion for Other Quantities. Maps: Properties. Manipulations. Symmetries. Representations. Spectrometers. Introduction. Momentum Spectrometers. Mass Spectrometers. Reconstructive Correction of Aberrations. Aberration Correction via Repetitive Symmetry. Repetitive Systems. Linear Theory. Parameter Dependent Linear Theory. Normal Forms. Syplectic Tracking.

Details

No. of pages:
318
Language:
English
Copyright:
© 1999
Published:
Imprint:
Academic Press
eBook ISBN:
9780080577746
Print ISBN:
9780120147502
Print ISBN:
9780124014923

Reviews

@from:Praise for the Series @qu:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf." @source:--MRS BULLETIN @qu:"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." @source:--J.A. Chapman in LABORATORY PRACTICE