Metrology at the Frontiers of Physics and Technology

Metrology at the Frontiers of Physics and Technology

1st Edition - October 22, 1992

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  • Editors: L. Crovini, T.J. Quinn
  • eBook ISBN: 9780444597830

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The spectroscopy of trapped ions or laser-cooled atoms offers the prospect of visible frequency standards to match or even exceed the accuracy of the caesium standard. The development of satellite methods for time comparisons has improved by more than an order of magnitude the accuracy with which national laboratories can routinely compare their clocks. Mechanical metrology has not been left behind. Driven by the need to improve manufacturing technology, major advances have taken place in computer control machining and mechanical measuring systems. These, and many other fascinating developments in the field of metrology are presented in this book.

Table of Contents

  • Foreword (L. Crovini and T.J. Quinn). The evolution of metrology during the last decade (A. Bray). Uncertainity and error in physical measurements (E.R. Cohen). The continuing evolution in the definitions and realisations of the Si units of measurement (B.W. Petley). Quantum electrodynamics and fundamental constants (R.N. Faustov). Experiments on gravitation (A. Cook). Metrology and the logical structure of physics (A. Cook). Detectors of gravitational waves (G. Pizzella). Experiments on the "fifth force" (C.C. Speake). Recent advances in mass standards and weighing and perspectives for a new definition of the kilogram (T.J. Quinn). The quantum Hall effect (E. Braun). Design and operation of series-array Josephson voltage standards (R.L. Kautz). The development of the international temperature scale of 1990 (L. Crovini). The metrology of temperature below 1k (K. Grohmann). Cryogenic radiometry (J.E. Martin). Laser cooling of atoms and ion trapping for frequency standards (C. Salomon). Laser frequency stabilisation and measurement (Y.S. Domnin). Time scales (S. Leschiutta). Atomic time scales (S. Leschiutta). Metrological aspects of fundamental astronomy (F. Mignard). Metrology applications of STM, AFM and X-ray interferometry (K. Carneiro, L.L. Madsen and L. Nielsen). High precision manufacturing in an advanced industrial economy (P.A. McKeown).

Product details

  • Language: English
  • Copyright: © North Holland 1992
  • Published: October 22, 1992
  • Imprint: North Holland
  • eBook ISBN: 9780444597830

About the Editors

L. Crovini

T.J. Quinn

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