Machine Vision for Inspection and Measurement  - 1st Edition - ISBN: 9780122667190, 9780323155588

Machine Vision for Inspection and Measurement

1st Edition

Editors: Herbert Freeman
eBook ISBN: 9780323155588
Imprint: Academic Press
Published Date: 28th June 1989
Page Count: 332
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Description

Machine Vision for Inspection and Measurement contains the proceedings of the Second Annual Workshop on Machine Vision sponsored by the Center for Computer Aids for Industrial Productivity (CAIP) at Rutgers University and held on April 25-26, 1988 in New Brunswick, New Jersey. The papers explore the application of machine vision to inspection and measurement and cover topics such as the problem of object-pose estimation and depth recovery through inverse optics. The use of machine vision techniques in inspection of integrated circuits and semiconductor wafers is also discussed. Comprised of 11 chapters, this book opens with the problem of using fine-grained parallel machines for VLSI inspection. The discussion then turns to a variety of real-life applications of machine vision, including inspection of integrated circuits, semiconductor wafers, TV-tube glass, and mechanical parts. The use of machine vision to measure the curvature of the human cornea for vision correction and contact lens fitting purposes is also considered. The remaining chapters focus on motion estimation from stereo sequences using orthographic-view algorithms; photometric sampling for determining surface shape and reflectance; and efficient depth recovery by means of inverse optics. A chapter addresses the question of whether the industry is ready for machine vision and comes up with some optimistic predictions. This monograph will be of interest to practitioners in the fields of computer science and applied mathematics.

Table of Contents


Preface

Contributors

Pose Estimation from Corresponding Point Data

Connectivity and Spacing Checking with Fine Grained Machines

Efficient Depth Recovery through Inverse Optics

Motion Estimation from Stereo Sequences Using Orthographic-View Algorithms

Photometric Sampling: A Method for Determining Shape and Reflectance of Surfaces

Precise Measurement of the Curvature of the Human Cornea

Applied Robot Vision: Combining Workpiece Recognition and Inspection

Is Industry Ready for Machine Vision? - A Panel Discussion

Finding and Evaluating Defects in Glass

Machine Vision Techniques for Integrated Circuit Inspection

Machine Vision for Semiconductor Wafer Inspection

Index

Details

No. of pages:
332
Language:
English
Copyright:
© Academic Press 1989
Published:
Imprint:
Academic Press
eBook ISBN:
9780323155588

About the Editor

Herbert Freeman