Ion Beams for Materials Analysis

Ion Beams for Materials Analysis

1st Edition - November 28, 1989

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  • Editors: R. Bird, J. Williams
  • eBook ISBN: 9780080916897

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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.


Research scientists in chemistry, archaeology, and analytical techniques.

Table of Contents

  • Concepts and Principles of Ion Beam Analysis. Techniques and Equipment. High Energy Ion Scattering Spectrometry. Nuclear Reactions. Ion Induced X-ray Emission. Channelling. Depth Profiling of Surface Layers during Ion Bombardment. Low Energy Ion Scattering from Surfaces. Ion Scattering from Surfaces and Interfaces. Microprobe Analysis. Critical Assessment of Analysis Capabilities. General Methods. Directory of Materials. Data Lists.

Product details

  • No. of pages: 719
  • Language: English
  • Copyright: © Academic Press 1989
  • Published: November 28, 1989
  • Imprint: Academic Press
  • eBook ISBN: 9780080916897

About the Editors

R. Bird

Affiliations and Expertise

Auburn University, Alabama

J. Williams

Affiliations and Expertise

Microelectronics and Materials Technology Centre, RMIT

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