Identification of Defects in Semiconductors - 1st Edition - ISBN: 9780127521657, 9780080864495

Identification of Defects in Semiconductors, Volume 51B

1st Edition

Serial Editors: R. K. Willardson Eicke Weber
Serial Volume Editors: Michael Stavola
Hardcover ISBN: 9780127521657
eBook ISBN: 9780080864495
Imprint: Academic Press
Published Date: 20th October 1998
Page Count: 434
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Table of Contents

List of Contributors. Preface. G. Davies, Optical Measurements of Point Defects. P.M. Mooney, Defect Identification Using Capacitance Spectroscopy. M. Stavola, Vibrational Spectroscopy of Light Element Impurities in Semiconductors. P. Schwander, W.D. Rau, C. Kisielowski, M. Gribelyuk, and A. Ourmazd, Defect Processes in Semiconductors Studied at the Atomic Level by Transmission Electron Microscopy. N.D. Jager and E.R. Weber, Scanning Tunneling Microscopy of Defects in Semiconductors. Subject Index. Contents of Volumes in This Series.


Description

List of Contributors. Preface. G. Davies, Optical Measurements of Point Defects. P.M. Mooney, Defect Identification Using Capacitance Spectroscopy. M. Stavola, Vibrational Spectroscopy of Light Element Impurities in Semiconductors. P. Schwander, W.D. Rau, C. Kisielowski, M. Gribelyuk, and A. Ourmazd, Defect Processes in Semiconductors Studied at the Atomic Level by Transmission Electron Microscopy. N.D. Jager and E.R. Weber, Scanning Tunneling Microscopy of Defects in Semiconductors. Subject Index. Contents of Volumes in This Series.

Readership

Researchers, graduate students and practitioners in materials science (electronic materials field), and electrical engineering (field of electronic devices).


Details

No. of pages:
434
Language:
English
Copyright:
© Academic Press 1999
Published:
Imprint:
Academic Press
eBook ISBN:
9780080864495

About the Serial Editors

R. K. Willardson Serial Editor

Affiliations and Expertise

WILLARDSON CONSULTING SPOKANE, WASHINGTON

Eicke Weber Serial Editor

Affiliations and Expertise

Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany

About the Serial Volume Editors

Michael Stavola Serial Volume Editor

Affiliations and Expertise

Lehigh University, Bethlehem, Pennsylvania