Hybrid Microcircuit Reliability Data - 1st Edition - ISBN: 9780080205359, 9781483138275

Hybrid Microcircuit Reliability Data

1st Edition

Authors: Yong Zhou
eBook ISBN: 9781483138275
Imprint: Pergamon
Published Date: 1st January 1976
Page Count: 216
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Description

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.

Table of Contents


Introduction

Section 1

Experienced vs Predicted Failure Rates

Figure 1 User Experience vs Predicted Failure Rates

Table 1 User Data

Section 2

Screening Summary

Table 2 Screening Fallout Rejected/Tested

Table 3 Distribution of Fallouts by Test Method(%)

Table 4 Rejected/Tested

Table 5 Normalized Distribution of Fallout(%)

Table 6 Environmental Sequence Results

Table 7 Summary of Screening Results

Section 3

Failure Classifications

Table 8 Thin Film Failure Analysis Summary

Table 9 Thick Film Failure Analysis Summary

Section 4

Cross Reference Index

Section 5

Detailed Test Data Tabulation

Beckman Inst. Inc.

Thick Film Linear

Centralab (Div of Globe Union)

Thick Film Resistor Array

Thick Film Digital

Circuit Technology Inc.

Thick Film Digital

Thick Film Linear

Collins Radio Co

Thin Film Digital

Semiconductor Digital

Thin Film Linear

Semiconductor Linear

Crystalonics

Thin Film Digital

CTS Microelectronics

Thick Film Digital

Thick Film Linear

Thick Film N/A

Dale Electronics Inc

Thick Film N/A

Thin Film N/A

Dupont Electric Prods

Thick Film N/A

Electro-Materials Corp.

Thick Film N/A

Electronic Communications Inc.

Thin Film Linear

Fairchild Semiconductor

Thin Film Digital

Thin Film Linear

Thin Film N/A

General Instruments

Thick Film Linear

GTE Sylvania

Semiconductor Digital

Halex

Thin Film Linear

Thin Film Digital/Linear

Hewlett Packard

Thin Film Digital

Hughes Aircraft Co.

Thick Film Linear

Thin Film Linear

Intersil Inc.

Thin Film Digital

Lockheed Electronics

Thick Film Digital

Micro Network Corp

Thin Film Digital

Semiconductor Digital

Motorola Semiconductor

Thin Film Digital

Thin Film Linear

Thick Film Linear

Semiconductor Linear

National Semiconductor

Thick Film Digital

Thick Film Linear

Philco Ford Corp

Thin Film Digital

Thin Film Linear

Precision Monolithics

Thin Film Linear

Raytheon Corporation

Thick Film Digital

SCS Micro Systems

Semiconductor Digital

Siliconix

Thin Film Digital

Sprague Electric Co

Semiconductor Digital

Thin Film Linear

Thin Film N/A

Sylvania Electric Prod

Semiconductor Digital

Teledyne Philbrick

Thin Film Linear

Teledyne Semiconductor (AMELCO)

Thin Film

Thin Film Linear

Texas Instruments

Thin Film Digital

Thin Film Linear

TRW Electronics

Thick Film Digital

Proprietary

Thick Film Digital

Thin Film Digital

Semiconductor Digital

Thick Film Linear

Thin Film Linear

Appendix

Hybrid Microcircuit Descriptor Code Interpretations


Details

No. of pages:
216
Language:
English
Copyright:
© Pergamon 1976
Published:
Imprint:
Pergamon
eBook ISBN:
9781483138275

About the Author

Yong Zhou

Professor Yong Zhou is a recognized expert in the field of non-linear difference equations and their applications in China. He was Editor-in-Chief of Journal of Dynamical Systems and Differential Equations over 2007-2011, and is present Guest Editor at Optimization (T&F), Nonlinear Dynamics and Journal of Vibration and Control (Sage), and at Elsevier former Guest Editor of Computers & Mathematics with Applications over 2010-2012 and Applied Mathematics and Computation over 2014-2015.

Affiliations and Expertise

Faculty of Mathematics and Computer Sciences, Zhejiang Normal University, P.R. China.