Fundamentals of Energy Dispersive X-Ray Analysis - 1st Edition - ISBN: 9780408110310, 9781483164007

Fundamentals of Energy Dispersive X-Ray Analysis

1st Edition

Butterworths Monographs in Materials

Authors: John C. Russ
Editors: M. Ashby Frs R. Kiessling J. Charles
eBook ISBN: 9781483164007
Imprint: Butterworth-Heinemann
Published Date: 3rd July 1984
Page Count: 314
Sales tax will be calculated at check-out Price includes VAT/GST
Price includes VAT/GST
× DRM-Free

Easy - Download and start reading immediately. There’s no activation process to access eBooks; all eBooks are fully searchable, and enabled for copying, pasting, and printing.

Flexible - Read on multiple operating systems and devices. Easily read eBooks on smart phones, computers, or any eBook readers, including Kindle.

Open - Buy once, receive and download all available eBook formats, including PDF, EPUB, and Mobi (for Kindle).

Institutional Access

Secure Checkout

Personal information is secured with SSL technology.

Free Shipping

Free global shipping
No minimum order.


Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays.

The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Table of Contents

1 X-Ray Emission 2 Wavelength Dispersive Spectrometers 3 Energy Dispersive Spectrometers 4 Electron Penetration in Solids 5 Monte-Carlo Modeling 6 X-Ray Absorption 7 Secondary Fluorescence 8 Applying the Corrections (Quantitative Analysis) 9 Standards: Real, Complex and Imaginary 10 Accuracy and Errors 11 Spectrum Processing 12 Background in Electron Excited Spectra 13 Thin Sections in STEM and TEM 14 Ultra-Low Energies 15 X-Ray Distribution Maps 16 Heterogeneous Samples 17 Less Common Methods 18 X-Ray Fluorescence-Fundamentals 19 Regression Models 20 Hardware for XRF 21 Sample Effects 22 Scattering, Background and Trace Element Analysis 23 Modifying the Excitation Function 24 Other Ways to Excite the Sample 25 Sorting, Tagging and Matching 26 Conclusions References Index


No. of pages:
© Butterworth-Heinemann 1984
eBook ISBN:

About the Author

John C. Russ

About the Editor

M. Ashby Frs

R. Kiessling

J. Charles

Ratings and Reviews